ASTM F1845 – Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
1.1 This test method determines the concentrations of trace metallic impurities in high purity (99.99 wt. % pure, or purer, with respect to metallic trace impurities) aluminum-copper, aluminum-silicon and aluminum-copper-silicon alloys with major alloy constituents as follows:
|
|
aluminum |
Greater than 95.0 % |
|
|
copper |
Less or equal than 5.0 % |
|
|
silicon |
Less or equal than 5.0 % |
Product Details
- Published:
- 05/01/2016
- Number of Pages:
- 5
- File Size:
- 1 file , 80 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
