IEC 60748-11-1 Ed. 1.0 b – Semiconductor devices – Integrated circuits – Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
Product Details
- Edition:
- 1.0
- Published:
- 04/01/1992
- Number of Pages:
- 71
- File Size:
- 1 file , 2.5 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
