Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
Product Details
- Edition:
- 1.0
- Published:
- 04/12/2002
- Number of Pages:
- 15
- File Size:
- 1 file , 510 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
