IEEE 759 – IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
New IEEE Standard – Inactive-Withdrawn.Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.
Product Details
- Published:
- 12/15/1984
- ISBN(s):
- 0738107158, 9780738107158
- Number of Pages:
- 0
- File Size:
- 1 file , 520 KB
- Product Code(s):
- STDWD09803
- Note:
- This product is unavailable in Russia, Belarus
